Used NANOMETRICS NanoSpec AFT 210 for sale

Mask & Wafer Inspection

Manufacturer

NANOMETRICS

Model

NanoSpec AFT 210

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8 results

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Thin film thickness measurement system Manual included.

159

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Film thickness measurement system, 5".

112

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Mask and wafer inspection.

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Thickness measurement system.

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Thickness measurement systems, 6".

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Automatic film thickness system, 8" 1993 vintage.

111

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Automatic film thickness system, 8" 1993 vintage.

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Film thickness measurement system, 6".