Used NANOMETRICS NanoSpec AFT 210 #9284966 for sale

NANOMETRICS NanoSpec AFT 210 is a mask and wafer inspection equipment designed for the semiconductor industry. It is an automated system that provides complete coverage and analysis of wafer-level defects, including both foreign and native particle defects. It is capable of detecting and measuring particles over a wide range of sizes, down to the nanometer (nm) level. With its high-speed imaging capability, the NanoSpec can provide rapid analysis of particles and defects at the wafer level. The unit consists of an automated mask inspection module, a wafer inspection module, and a high-speed imaging machine. The automated mask inspection module is equipped with a laser scanner which accurately scans around the mask edges to detect defects and particles in real time. This is paired with a spectroscopic imaging technology which is able to detect and measure particles of different sizes and types. The wafer inspection module is used to detect defects at the wafer level. It can detect particles of different sizes, shapes, and materials with different properties. It also has a high-resolution imaging tool which provides accurate and detailed images of the particles and defects. The asset also has a high-speed imaging (HSI) module, which is capable of capturing and analyzing particle images at rates up to 1,000 frames per second. This provides higher resolution images of particles and defects, which are then analyzed for potential corrective actions. The NanoSpec also comes with a data analysis suite to analyze the detected particles and defects and generate comprehensive reports. The suite includes both a statistical and visual inspection report, as well as detailed images which allow for further inspection and analysis. In addition, the NanoSpec has an intuitive user interface which allows engineers to easily access and configure its many feature and options. Furthermore, it is a scalable model that can be easily updated with new features and functionality as needed. NANOMETRICS NANOSPEC / AFT 210 is an advanced mask and wafer inspection equipment which provides complete coverage for semiconductor production facilities. With its high-speed imaging capability, detection of a wide range of particle sizes, and intuitive user interface, NanoSpec AFT 210 makes it the perfect choice for semiconductor mask and wafer inspection.