Used RUDOLPH / AUGUST AXI-935D #9260093 for sale

RUDOLPH / AUGUST AXI-935D Mask and Wafer Inspection Equipment is a state-of-the-art wafer inspection system that can detect defects, anomalies, and other features on a variety of different substrates, including silicon and glass wafers. It has a very high resolution inspection capability, meaning it can detect features as small as a few microns on a variety of different substrates. This unit is also capable of performing precise measurements of features, such as size, pitch, width, and other geometric elements to provide detailed information about substrates and components. AUGUST AXI-935D Mask and Wafer Inspection Machine employs the use of two high-resolution digital cameras to inspect substrates at high speed. The tool has variable optical magnification up to 1000X that allows for detailed analysis of surface features on substrates and components. In addition, the asset gives the user the ability to adjust color, contrast, and brightness settings to ensure that features are visible during the inspection processes. RUDOLPH AXI-935D Mask and Wafer Inspection Model is also equipped with software that is designed to allow users to make automated measurements, detect anomalies, and analyze feature size, pitch, and profile to quickly identify potential defects and other issues. The software also allows users to adjust optical parameters, such as focus, exposure, and imaging filters, as well as to capture and save images of the inspected substrates. AXI-935D Mask and Wafer Inspection Equipment also features a high-power laser system that is capable of quickly and accurately scanning substrates to detect different types of defects. In addition, the unit utilizes optical microscopy to provide fine detail analysis of surface features on substrates, and this is combined with the advanced software that can rapidly identify anomalies and other issues. Overall, RUDOLPH / AUGUST AXI-935D Mask and Wafer Inspection Machine is a highly advanced, versatile tool that utilizes advanced inspection and analysis technologies to provide exceptional quality control for a wide range of substrates. It has been designed to allow users to quickly and accurately detect anomalies, defects, and other issues on substrates with an incredibly high level of accuracy and precision.