Used RUDOLPH / AUGUST AXI-S #9214948 for sale

RUDOLPH / AUGUST AXI-S
ID: 9214948
Wafer Size: 12"
Vintage: 2006
Defect inspection system, 12" 2006 vintage.
RUDOLPH / AUGUST AXI-S is a mask and wafer inspection equipment designed to meet the needs of semiconductor, disk drive, and mask-making industries. The system uses a combination of optics, software, and high-accuracy detection hardware to detect defects in a wide range of product types. At the heart of AUGUST AXI-S unit is its advanced optical machine which combines a high-resolution digital camera with an automated color filter for defect inspections. The tool is capable of 20-nanometer-level defect detection, making it one of the most capable systems of its kind. In addition, users can customize the asset to inspect products of all sizes and shapes. The optical model is controlled by a set of proprietary software tools that provide users with the flexibility to adjust and fine tune the equipment to their specific needs. Additionally, the software is equipped with algorithms that enable automated defect detection, image processing, mask alignment, and reporting. To further support RUDOLPH AXI-S system, a set of dedicated hardware components are needed. These components include a laser scanner, a PC-based controller, a high-speed image acquisition card, and a dual-processor processor board. All together, these components allow the unit to achieve exceptional accuracy and processing power. Finally, AXI-S machine is also equipped with a comprehensive suite of peripheral controllers and equipment. This includes everything from pneumatic actuators for high-precision mask assembly, to user-programmable vision detection boards. All the peripheral components can be controlled by the tool's proprietary software, ensuring optimal performance and accuracy. In conclusion, RUDOLPH / AUGUST AXI-S asset provides users with an advanced, high-precision mask and wafer inspection model. The combination of optics, software, and dedicated hardware components makes it one of the most capable systems of its kind, enabling users to detect minute defects in a wide range of product types. Furthermore, by providing users with a comprehensive suite of peripheral equipment and controllers, the equipment is able to provide fully customizable and accurate mask and wafer inspection results.
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