Used RUDOLPH / AUGUST AXI-S #9243730 for sale

RUDOLPH / AUGUST AXI-S is a fully automated, high speed mask and wafer inspection equipment designed for modern LED, OLED and 2D/3D IC, MEMS, and advanced microelectronics production lines. The system allows users to inspect masks and wafers at up to 100mm/second through a variety of automatic video processing and data analysis methods. AUGUST AXI-S features a 10.4 inch color LCD touch screen, allowing operators to easily access all of the setting and parameters required for effective inspection. The unit also features a range of camera specifications, such as line scan, full-frame, matrix and mosaic cameras, which are capable of scanning objects of various shapes and sizes. RUDOLPH AXI-S can also detect a wide range of defects, including particle/pad contamination, solder bridging, pinholes, and edge defects, using the powerful image recognition algorithms. The level of accuracy is quite impressive, since the machine can detect defects as small as 1µm. In addition, AXI-S offers advanced features such as a "multi-scan" feature which allows for simultaneous inspection of both wafer and mask surfaces. This prevents misregistration errors which can occur when using standard imaging systems. Furthermore, the tool includes a defect analysis feature which allows users to analyze and quantify defects, helping to reduce the amount of time spent on repetitive inspections. Also, RUDOLPH / AUGUST AXI-S offers a powerful software which allows for automated inspection and defect analysis. The software makes use of advanced algorithms to detect and classify defects while users can configure a wide range of settings for customizing the inspection and sorting parameters. The asset's software also includes a library of defect classifiers, making it much easier to configure for different tasks. Overall, AUGUST AXI-S is an excellent mask and wafer inspection model capable of providing high quality and efficient inspection of masks and wafers. With its wide variety of advanced features, such as advanced image recognition algorithms, multi-scan capabilities, powerful software, and defect analysis functions, RUDOLPH AXI-S lies at the forefront of modern mask and wafer inspection systems.