Used RUDOLPH / AUGUST AXI-S #9262831 for sale

RUDOLPH / AUGUST AXI-S is an advanced mask and wafer inspection equipment designed for mass production, quality control, and production line testing. It is capable of rapid, high-resolution inspection based on multiple image sensors that detect both visible and non-visible characteristics of masks and wafers. With its large field of view and ability to detect defects in various areas on the die, this system offers a comprehensive end-to-end solution for compliant, high performance mask and wafer inspection. The unit consists of an optical head, a controller, and a set of image acquisition devices. The optical head is designed with a high numerical aperture which provides accurate image resolution and high contrast, ensuring reliable defect inspection. It is equipped with advanced pattern recognition algorithms that allow the machine to detect very small defects on the surface of the wafer or mask. The controller contains a user-friendly interface that allows operators to configure and control the tool quickly and easily. The asset is also compatible with a variety of imaging and processing software that enable quick testing and review of images. It features a number of automation features, such as an automatic focus adjustment and contrast optimization, that streamline the inspection process. The model is capable of quickly scanning and detecting defects on multiple wafers or masks simultaneously. Additionally, the built-in user interface supports multiple screen windows for simultaneous inspection. AUGUST AXI-S also provides comprehensive traceability and quality reporting capabilities. The equipment is designed to produce detailed defect reports, which can be used as evidence in quality reviews. The system also provides an integrated LED-backlit illumination unit for wafer and mask inspection. This illumination machine provides uniform illumination to the inspected area and is easily adjustable for various tasks. Overall, RUDOLPH AXI-S is an advanced mask and wafer inspection tool that combines advanced optics and image processing algorithms with intuitive operation for fast and accurate mask and wafer inspection. It is capable of quickly detecting defects on multiple wafers and masks simultaneously and provides comprehensive traceability and quality reporting capabilities. Further, the built-in LED-backlit illumination asset ensures uniform illumination to the inspected area, and the user interface supports multiple screen windows for simultaneous inspection.