Used RUDOLPH / AUGUST AXI-S #9298337 for sale

RUDOLPH / AUGUST AXI-S is a highly accurate and reliable mask and wafer inspection equipment for assessing the conformance of substrates. It is capable of scanning wafers and semiconductor mask panels with a 0.5 micron resolution. The wafers are carefully aligned and placed onto a X-Y stage which allows for rapid and accurate scanning of large areas in just seconds. The inspection system is equipped with a high-resolution CCD camera, LED light source and a computer controlled microscope unit. The microscope machine has the ability to zoom in and out as well as make precise positioning adjustments. The CCD camera captures fine and detailed images of the substrates which are then processed and analyzed by the computer software. The LED light source provides an optimal illumination for the inspection tool while the optical asset ensures a clear image. The inspection model is capable of detecting a wide range of parameters such as surface roughness, defects, non-uniformities, particle contamination, surface flaws, and more. It can scan entire panels or focus on specific areas of interest for in-depth analysis. The equipment can store data and track trends over a period of time for more accurate results. AUGUST AXI-S inspection system is a versatile tool which makes it suitable for numerous applications in the semiconductor industry, and the data collected is extremely valuable for developers, producers, and inspectors. The state-of-the-art features and advanced technologies of the unit make it a reliable and efficient solution for quality control. It provides reliable performance, repeatable results, and high precision for all types of wafers and mask substrates. Overall, the robust features and technologies of RUDOLPH AXI-S inspection machine make it an ideal platform for mask and wafer inspection. The data collection capabilities, high precision, and repeatability of the tool provide users with an efficient and reliable machine for detailed substrate analysis and inspection.