Used RUDOLPH / AUGUST AXI-S930B #293663056 for sale

RUDOLPH / AUGUST AXI-S930B mask and wafer inspection equipment offers advanced features for improved quality control in a wide range of applications. AUGUST AXI-S930B is a 3D automated measurement system designed to provide visual control and accurate numerical analysis of wafers and masks. The Unit is capable of automatically detecting a variety of defect types in a wide range of process conditions. The superior speed and accuracy of RUDOLPH AXI-S930B enables rapid visual inspection of various types of wafers and masks such as holograms, color filters, and masks with sub-micron features. In addition, the machine provides exact dimensional measurements of defects and geometries on wafers and masks. AXI-S930B features advanced optics that includes a CCD camera with Digital Image Intensity (DIIM) technology. This allows for an increase in inspection speed, superior signal-to-noise ratio, better image resolution, and more reliable measurements. It also uses high-powered illumination sources that provide the best contrast and resolution for visual inspection and metrology. The unit is equipped with dedicated image processing hardware, which allows for a wide range of parameters to be set for different applications. This includes settings related to noise reduction and false-alarm reduction. It also includes a "no-touch" calibration routine that prevents damage to the machinery from accidental adjustments. RUDOLPH / AUGUST AXI-S930B operates on either Windows or Macintosh operating systems, and the graphical user interface allows operations to be customized to specific tasks. Furthermore, an easy-to-use software package provides statistical data output for complete traceability and reporting. In addition to its automated capabilities, AUGUST AXI-S930B also has manual operation features for rapid defect inspections. This feature is especially useful in defining and confirming the nature and particular features of defects found during operation. RUDOLPH AXI-S930B mask and wafer inspection tool offers superior performance in a variety of industrial and academic applications. Its superior optics, high processing speeds, detailed analysis functions, and intuitive user interface make it an ideal choice for customers looking for advanced and reliable inspection and metrology solutions.