Used RUDOLPH / AUGUST NSX 115 #293595875 for sale

RUDOLPH / AUGUST NSX 115 is a state-of-the-art mask & wafer inspection equipment that utilizes powerful imaging technology and advanced pattern detection algorithms to detect defects on both masks and wafers used in the manufacture of various semiconductor products. Utilizing a 5-inch LCD touch screen, the system offers an easy to use user interface, allowing operators to quickly monitor the quality of the production process. Using a monochrome digital camera and a proprietary scanning head, the unit is capable of simultaneously capturing two images and feature detection in a single, high-speed pass over the sample. A high resolution and high-gain image sensor provides an increased image resolution of all types of defects, while simultaneous planar imaging, vertical and horizontal pattern scanning, line art and bitmap scanning is enabled by configurable peak detection settings and advanced deconvolution techniques. The machine additionally offers a library of selected wafer inspection algorithms and algorithms for mask inspections, tailored to specific defect types, that can be configurable to the user's specific application or test requirements. For maximum detection capability, AUGUST NSX 115 offers a wide range of features and settings including defect library, histogram editing and shifting, plus object classifier and segmentation. Finally, the tool provides true color imaging, automatic defect classification and scoring, defect analysis and sorting, and an enhanced library asset which can assist operators in defect analysis and reporting. This allows the operator to understand the source of the defect and aid in failure analysis, aiding them in making quick corrections and minimizing production line delays. Overall, RUDOLPH NSX 115 Mask & Wafer Inspection Model is a powerful tool for ensuring quality in the manufacture of semiconductor products. Its combination of advanced scanning technologies, fault detection algorithms and user-friendly interface ensures that it is capable of efficiently and quickly identifying, analyzing and quantifying even the most difficult defects, giving operators the tools they need to guarantee a quality product.