Used RUDOLPH / AUGUST NSX 115 #293630423 for sale

ID: 293630423
Automatic Optical Inspection (AOI) system.
RUDOLPH / AUGUST NSX 115 mask and wafer inspection equipment is designed for fast, accurate inspection and analysis of semiconductor devices. This advanced system offers superior performance for both mask and wafer surfaces. Its advanced software capabilities enable detailed analysis for critical defect management and improved performance. AUGUST NSX 115 features state-of-the-art optics, including a high-resolution RGB camera and a unique lighting unit, both of which enable pixel-level characterization of masking materials, wafer surfaces, and other features. The RGB camera provides static and dynamic imaging of details within the mask and wafer surfaces, allowing the user to evaluate a wide range of defects. The dynamic lighting machine provides bright, even illumination across the entire surface, ensuring consistent readings. RUDOLPH NSX 115 offers a wide range of measurement options, including inspection of various sizes and shapes of masks, line scan analysis for critical defect measurement, and a wide range of image analysis and pattern recognition features. The tool is capable of measuring a variety of materials, including patterned and non-patterned wafers, as well as organic and plasma-enhanced dielectrics. Additionally, multiple detection algorithms and robotic fixtures enable users to customize their inspection setup. NSX 115 is built with a modular design, enabling the user to easily customize and configure the asset for various inspection applications. It also features a user-friendly touch screen interface, enabling quick and intuitive operation. Additionally, the model has high reliability and repeatability, ensuring consistent results over time. Overall, RUDOLPH / AUGUST NSX 115 is an advanced equipment designed to provide fast, accurate inspection and analysis of masks and wafers. With its high-resolution optics, customizability, and user-friendly interface, AUGUST NSX 115 offers a comprehensive solution for the analysis of a variety of materials and devices.
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