Used RUDOLPH / AUGUST NSX 115 #293637227 for sale

RUDOLPH / AUGUST NSX 115 Mask & Wafer Inspection Equipment is a high-resolution automated semiconductor optoelectronic inspection system. It utilizes advanced imaging techniques to detect structural and electrical defects in the production of semiconductor wafers. The unit is robust, flexible and designed for use in high-volume applications such as semiconductor fabs for their inspection processes. AUGUST NSX 115 inspection machine consists of a 4-arm indexer, a 4-path imaging platform and a 4-fingered manipulation arm for specimen sample handling. The tool has four imaging heads, each with a resolution of up to 16 megapixels. It integrates state-of-the-art lighting and optics components, as well as a powerful embedded processor to enable fast and efficient image capture and analysis. The asset also includes apertures and filter holders, allowing users to select different approaches to optimize inspection parameters. RUDOLPH NSX 115 model is able to recognize a variety of masks, wafer structures and defect types. It supports both single defect detection and multi-parameter if necessary. Moreover, NSX 115 equipment includes a comprehensive graphical user-interface, allowing users to easily program and monitor their inspection processes. The system is also equipped with various data analysis and reporting software tools, facilitating efficient and comprehensive defect reporting and trending. Finally, RUDOLPH / AUGUST NSX 115 unit is equipped with a host of peripheral components, including an automated sample storage machine, an integrated vision tool and a high-speed sorting function. The asset ensures accurate and reliable results, with minimum false alarm rates. Furthermore, it is designed for easy installation and maintenance, minimizing downtime for production lines. In summary, AUGUST NSX 115 Mask & Wafer Inspection Model is an advanced, high-resolution automated semiconductor inspection equipment, designed for high-volume semiconductor fabs. It offers multiple imaging heads and advanced features, allowing users to optimize their inspection process. Moreover, the system's data analysis and reporting tools enable efficient and comprehensive defect reporting and trending.