Used RUDOLPH / AUGUST NSX 115 #293638622 for sale

ID: 293638622
Vintage: 2008
Automatic Optical Inspection (AOI) system 2008 vintage.
RUDOLPH / AUGUST NSX 115 is a mask & wafer inspection equipment designed for the inspection of semiconductor masks used for lithography and photomasks. Utilizing advanced image recognition and optical inspection technologies, AUGUST NSX 115 is able to efficiently and accurately identifymanufacturing defects in semiconductor wafers on a submicron level. RUDOLPH NSX 115 utilizes RGB LED illumination to improve the measurement accuracy of submicron defects. This LED lighting is accompanied by advanced image processing software, enabling the system to accurately distinguish patterns, defects, and changes in the mask structure. Beyond submicron level rectification, the unit can also detect defects on a macro level with its automatic defect classification machine (ADC). NSX 115 features a built-in 12-inch S4 monitor that displays the image output of the tool. The results of the inspection process can be easily reviewed and evaluated with RUDOLPH / AUGUST NSX 115's specially designed user interface. AUGUST NSX 115 also offers an automated wafer loading/discarding asset, allowing for maximum efficiency and throughput. In addition to mask & wafer inspection, RUDOLPH NSX 115 is also compatible with a wide range of specialized application software, such as specialized packages for photomask processing. The application software has a comprehensive library of imaging parameters that enable the user to customize their inspection process. The user can also process various substrates, including silicon wafers, encapsulated substrates, or bare-die wafers, making it an efficient tool for any semiconductor process inspection. In summary, NSX 115 mask & wafer inspection model is a highly advanced and efficient tool for semiconductor process inspection. With its LED lighting, advanced image processing software, and application-specific software packages, RUDOLPH / AUGUST NSX 115 is able to accurately identify defects on both submicron and macro levels. AUGUST NSX 115 also features an automated wafer loading/discarding equipment, making it an ideal choice for any inspection process.
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