Used RUDOLPH / AUGUST NSX 115 #9289669 for sale

RUDOLPH / AUGUST NSX 115 mask and wafer inspection equipment is a high-end automated Quality Assurance tool that enables manufacturers and production lines to detect defects in their products quickly and accurately. AUGUST NSX 115 system combines the detailed image capture of a mask microscope with the automated accuracy of a wafer inspection unit. RUDOLPH NSX 115 combines the use of large field-of-view microscopy and full field-of-view (FFV) defect inspection. The FFV scanning uses a lens and charge-coupled device (CCD) to capture a large image of the entire wafer or mask. This image is then segmented into fields or sub-fields, and is then processed by the software's image analytics algorithm. This allows the machine to rapidly scan an entire mask or wafer and detect defects very quickly. In addition to the FFV scanning, the tool also provides additional mask and wafer inspection capabilities such as focus and photosensitometry assessment to maximize sensitivity and accuracy. Focus assessments evaluate the sharpness of the mask or wafer edges and photosensitometry measures the precise balance of color across the whole field of view. Both of these additional tests are performed in order to ensure that the masks and wafers are properly manufactured, and that any defects can be easily detected. NSX 115 also offers a variety of other advanced features that make it an ideal solution for mask and wafer inspection. These features include an integrated defect correction analysis tool which allows for easy and rapid severity corrections of any detected defects. The asset also includes built-in model and support capabilities such as a comprehensive online user guide, a graphical user interface with visual tools, and a remote monitoring equipment. RUDOLPH / AUGUST NSX 115 mask and wafer inspection system is a powerful and reliable automated Quality Assurance tool that has been designed to provide the highest level of accuracy and reliability. Its combination of large field-of-view microscopy, full field-of-view defect inspection, and a variety of other advanced features make it an ideal solution for high-end production lines and manufacturers wanting to guarantee the quality of their products.