Used RUDOLPH / AUGUST NSX 115 #9391359 for sale

RUDOLPH / AUGUST NSX 115 mask & wafer inspection equipment is a state-of-the-art inspection and metrology tool designed for inspecting and measuring defects and imperfections on semiconductor devices and wafers. The system is capable of capturing and detecting defects at the sub-micron level. AUGUST NSX 115 is the latest addition to AUGUST line of mask and wafer inspection systems. RUDOLPH NSX 115 is designed from a unit perspective, taking into account the entire wafer inspection process from mask to finished wafer. It incorporates advanced inspection sensors, including a set of four variable-mag optical, dark field optical, shielded fluorescence and multi-view optical microscopes. The machine also includes an advanced pattern analyzer that is capable of detecting and reporting on defect type, size, and location. The fully integrated environmental control tool ensures consistent performance in different environmental conditions. NSX 115's automated mask inspection subsystem is designed to identify and report wafer defects during the selection, patterning, and assembly stages. The asset's advanced image acquisition and defect recognition technology features advanced pattern recognition and parameter extraction capabilities. Additionally, RUDOLPH / AUGUST NSX 115's advanced wafer metrology capabilities enable measurements to be taken at sub-micron resolution, allowing for a comprehensive analysis of mask features and defects. The model is compatible with all leading semiconductor device manufacturing processes and includes an easy to use graphical user interface, making the equipment ideal for both mask and wafer inspection. Additionally, AUGUST NSX 115 is capable of exporting defect data to a multitude of software packages for final verification and report generation. RUDOLPH NSX 115 mask & wafer inspection system provides an effective, reliable method for accurately inspecting and measuring semiconductor devices and wafers.