Used RUDOLPH / AUGUST NSX 320 #9248723 for sale

RUDOLPH / AUGUST NSX 320 is an automated mask and wafer inspection equipment. The system is designed to provide a high level of defect detection and inspection capabilities for a broad range of application types. It can be used for both production and research of semiconductor chips, masks, and wafer inspections. AUGUST NSX 320 unit provides wafer-scale defect detection and inspection of opaque and patterned features. The machine features an optical microscope with automated cameras and light sources for easy and efficient inspections. An online image processing and defect detection algorithms allow the tool to accurately detect defect types including broken patterns, broken wires, and misaligned patterns. The asset also includes a defect review and analysis package which allows users to review defects detected by the model and create a report of any detected results. The equipment has a customizable user interface, which provides intuitive multi-dimensional defect reviews, including profile level and threshold tuning. This makes the system capable of a wide range of routine defect review and analysis tasks, allowing greater flexibility and throughput. The unit also encompasses a series of wafer-level defect clustering analysis features. This includes statistical classification tools that identify structure or feature variations, such as interconnectivity, irregularities, and shape parameters that might indicate potential form defects. It also allows users to quickly and accurately review defect patterns. RUDOLPH NSX 320 also has a unique "Smart Status" capability, which allows the machine to continually monitor defect trends. This enables real-time monitoring of defects, providing up-to-date feedback on performance and efficiency. Combined with other advances such as automated defect classification and pattern analysis, the tool can accurately detect and analyze defects quickly and efficiently, while providing improved defect detection and analysis capabilities. Overall, NSX 320 asset provides a robust, high-performance inspection platform for wafer, mask, and other semiconductor applications. The model offers defect detection and analysis capabilities that are unmatched in the industry. Its features, flexibility, and performance make it an ideal choice for enterprises looking to achieve in-depth defect detection and analysis for their semiconductor applications.