Used RUDOLPH / AUGUST NSX 320 #9271996 for sale

RUDOLPH / AUGUST NSX 320 is a mask and wafer inspection equipment used for semiconductor wafer fabrication facilities. This system features a 1K x 1K CCD operating at variable scan rates of up to 25kHz. The CCD is optically coupled to an array of fiberoptic imaging lenses for improved resolution that can detect defects as small as 0.8 microns. AUGUST NSX 320 is capable of multiple inspection modes including edge detection, polygon detection, particle inspection, backside inspection, and overlay alignment. With its built-in edge detection algorithm, the unit can accurately detect and measure wafer edges for accurate measurements, alignment, and placement of structures on the substrate. By utilizing advanced image processing techniques, RUDOLPH NSX 320 can differentiate sub-pixel level resolution and key statistics on features for further analysis. NSX 320 has a highly intuitive user interface that can be customized for individual inspection needs. The onboard controller can run multiple applications via an easy-to-use graphical user interface. Multiple levels of image analysis can be done in real time and image diagnostics can be logged remotely. This machine provides flexible data handling capabilities for integrated control and management of image databases. RUDOLPH / AUGUST NSX 320 is designed to be user-friendly and efficient. With fast setup and operation, this tool can reduce overall costs in long term maintenance and increase throughput while maintaining high quality inspection results. It features advanced optics for improved accuracy of detection of small defects with minimal false detections. It also provides advanced image processing features that enable reliable inspection and analysis with automated detection. This asset is ideal for inspecting various substrates in different inspection modes with maximum efficiency. With its integrated control, easy to use user interface, and advanced inspection capabilities, AUGUST NSX 320 is a reliable and accurate inspection model for wafer fabrication and semiconductor wafer processing industries.