Used RUDOLPH / AUGUST NSX 90 #9042209 for sale

RUDOLPH / AUGUST NSX 90
ID: 9042209
Vintage: 2006
Bump automatic defect inspection system 2006 vintage.
RUDOLPH / AUGUST NSX 90 Mask & Wafer Inspection System is a revolutionary new technology that is designed to inspect high-volume CMOS semiconductor wafers and masks. This device is capable of detecting defects down to the nanometer scale which makes it ideal for the semiconductor industry which relies on precision for their components. AUGUST NSX 90 utilizes an advanced optical sensing system which allows for fast and accurate automated inspection of wafers without the need for manual testing or sampling. The device is capable of measuring defects that are typically too small to be detected by the standard inspection processes used by the semiconductor industry. RUDOLPH NSX-90 is capable of detecting particles, cracks, voids and other defects in a precise and efficient manner. The device also uses a combination of light-scattering and image-based inspection techniques to detect physical defects and to check for wafer surface irregularities. RUDOLPH NSX 90 is highly efficient and cost-effective for the semiconductor industry as it features high throughput and exceptionally low cost of ownership. The device also offers a variety of flexible inspection parameters which can be adjusted to suit the specific deformations that need to be detected as well as customized light settings to accommodate the different levels of sensitivity necessary. The device also includes powerful software and hardware solutions that allow for the automated acquisition and analysis of results, so that the user can easily identify areas of the semiconductor wafer that need to be repaired or optimized. Furthermore, RUDOLPH / AUGUST NSX-90 includes user-defined inspection and measurement thresholds which enables customers to set their own parameters for wafer accuracy and repeatability. Overall, NSX-90 is an ideal or semiconductor and mask & wafer inspection applications. Its powerful features and capabilities enable users to consistently and highly accurately assess the condition of these components in a reliable and cost-effective manner. This device is sure to provide a valuable asset to the semiconductor industry for many years to come.
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