Used RUDOLPH / AUGUST NSX 90 #9222178 for sale

RUDOLPH / AUGUST NSX 90 Mask & Wafer Inspection Equipment is a highly advanced and specific wafer inspection system designed to ensure the quality control of silicon wafers for the semiconductor industry. The unit's ultra-high speed cameras capture images from bothabove and below the wafer under inspection, providing a total 360-degree view of the wafer's surface. This enables it to quickly detect any defects that might be present in a wafer, enabling operators to quickly and accurately determine the quality of the wafer without having to manually inspect the wafer surface. The machine also incorporates automatic defect recognition technology to provide further efficiency and accuracy. This technology allows the tool to quickly and accurately identify the most common types of defects in a wafer. This includes hot and dead pixels, dark spots, mask defects, scratches, contamination, and other common defects. With this technology, the asset can recognize defects even if they are extremely small or difficult to see with the naked eye. In addition to its defect recognition technology, AUGUST NSX 90 also includes dual beam Brightfield/Darkfield image capture and a wide array of imaging options. The dual beam Brightfield/Darkfield image capture allows the model to capture high-resolution images with both bright and dark contrast. This makes it easier to identify small defects in wafers that would otherwise go unnoticed. Additionally, the equipment also includes selectable contrast enhancement, color cross-hatching, and a variety of other image manipulations. RUDOLPH NSX-90 also includes a range of additional features that makes it particularly useful for performing wafer quality control. These features include an on-board PC, an intuitive user interface, digital report generation, and communication capabilities. Additionally, the system includes a calibration device for ease of use and accuracy. Ultimately, NSX-90 is an ideal unit for performing quick and accurate wafer inspections. Its advanced defect recognition technology and wide array of imaging features make it an efficient and reliable tool for quality control and assurance to help ensure the integrity of the finished product.