Used RUDOLPH / AUGUST NSX 95 #9384487 for sale

ID: 9384487
Wafer Size: 8"
Defect inspection systems, 8".
RUDOLPH / AUGUST NSX 95 mask and wafer inspection equipment is a state-of-the-art non-destructive imaging system designed for the rapid, accurate and reliable inspection of integrated circuit designs and defects. AUGUST NSX-95 unit allows inspection of up to 10 wafer stacks at a time. Each stack is scanned automatically in a high-speed, high-resolution sweep that is both cost and time effective. In addition, RUDOLPH NSX 95 is able to detect a wide variety of defects and patterns on wafers which can then be quantified. RUDOLPH NSX-95 utilizes a proprietary image processing algorithm, the Imaging Throughput Analysis Machine (ITAS) to detect, classify and process defects of all types. ITAS is an autonomous image analysis tool that allows for an intuitive user interface, providing an informative display of quickly measurable data, allowing the user to make decisions and comparisons quickly and efficiently. AUGUST NSX 95 is capable of accommodating up to 16 wafer carriers at once, which can be easily managed with the efficient loaded wafer automation asset (LWAS). LWAS can be programmed for different types of wafers and their respective parameters, maximizing the model productivity, reliability and accuracy. AUGUST NSX 95 delivers images of exceptional quality. A high speed, low noise CCD image sensor delivers pristine images with crisp resolution. The latest LED illumination technology ensures bright wafer images for accurate measurements, defect detection and pattern recognition. RUDOLPH NSX 95 utilizes sophisticated 3D non-contact surface probing technology which offers greater accuracy and repeatability than alternative 2D approaches. A total focus approach is used to eliminate image distortion and improve data accuracy. Additionally, a high dynamic range lens provides the highest level of image clarity and uniformity. RUDOLPH / AUGUST NSX-95 provides a fast and reliable equipment for users looking to gain quick, accurate and repeatable results in the field of mask and wafer inspection. The intuitive user interface, advanced processing techniques, and cutting-edge imaging techniques combine to make NSX-95 the perfect system for anyone looking to inspect wafers and masks.
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