Used RUDOLPH / AUGUST NSX 95 #9395555 for sale

RUDOLPH / AUGUST NSX 95 mask & wafer inspection equipment is a versatile, high-performance system designed for the reliable inspection of masks and wafers in semiconductor, flat panel display, and microelectronics manufacturing. AUGUST NSX-95 is capable of detecting both topological and overlay defects, and has the capability of full layer inspection. The unit utilizes a brightfield / dual color brightfield / DUV transmissive inspection technology, which provides users with the ability to inspect for both topological and overlay defects on single- as well as multiple-siked wafers. RUDOLPH NSX 95's high dynamic range detection coupled with its high-precision positioning permits the use of any combination of TFT and LCD substrates, including LCD flat panel displays, masks and wafers. NSX 95 is equipped with conventional auto-focusing and Auto-Slack Alignment (ASA) technologies which enable it to accurately scan the substrate during inspection. It also features Automatic Binning Counter (ABC) that enables statistical inspection based on complex arrays of defect features and allows automated object recognition. The machine's high sensitivity light-integration timing is capable of inspecting 0.1 um line structures and supports multiple zone/substrate/pixel field settings. It is also equipped with PowerPC 417 and an universal input/output tool which enables quick and accurate setup and inspection. The advanced tools provided include a Pattern Match Library, Multi-Defect Monitoring (MDM) for multi-site inspection, True Eye technology for defect identification, True Cog for discrimination of redundant defects, high sensitivity printer for fault-recording and a PC network interface for remote access and control. In addition, AUGUST NSX 95 mask & wafer inspection asset comes with a flexible and modular software architecture which provides user friendly, step-by-step operations. Automated automation capabilities are included to expedite setup times and provide reliable data accuracy. The model's comprehensive service offerings and local support provide comprehensive support for customers needing routine equipment maintenance or repairs. Overall, NSX 95 mask & wafer inspection system is an exceptional tool for failure analysis, quality control, and process control. It has the capability to accurately detect both topological and overlay defects on masks and wafers in a variety of substrates and is equipped with powerful tools for data analysis and automation. With its reliable performance, service and support, this unit is an ideal choice for semiconductor, flat panel display, and microelectronics manufacturing operations.