Used RUDOLPH / AUGUST WHS #9315424 for sale

RUDOLPH / AUGUST WHS
ID: 9315424
Macro defect inspection system 2006 vintage.
RUDOLPH / AUGUST WHS (Wafer and Mask Inspection Equipment) is an automated optical inspection system designed to quickly and accurately inspect and evaluate both semiconductor wafers and photomasks. This unit uses state-of-the-art automated image analysis technology to rapidly inspect both wafers and masks for defects, such as broken lines, particle contamination, scratches, streaks, burrs, and other forms of non-uniformity. This machine delivers a prompt and detailed description of any detected defects along with images of the affected area in order to facilitate defect diagnosis. The tool consists of a fully automated optical inspection table that is equipped with two high-resolution, high-speed cameras. Both cameras are capable of capturing images from the wafer and mask surface in order to provide a detailed visual assessment of the surface topography of the item under inspection. This asset is able to quickly and accurately scan a wide range of wafer and mask types due to its ability to adjust the lens and field-of-view of the camera accordingly. The camera images are then analyzed by the control unit, which is a dual-core processor capable of processing the information at an extremely high speed. This processor is also able to transmit data to the image memory, and vice versa, enabling efficient and reliable picture storage. AUGUST WHS is also equipped with a wafer stage, which is able to quickly move the wafer or mask from one side of the inspection table to the other while maintaining precise registration of the images as they are taken from both sides of the wafer or mask. This model also includes a number of users tools, such as a high-resolution image viewer and a report generator, which enable users to easily view images taken from the camera and to generate detailed reports of the inspection results. Overall, RUDOLPH WHS is an advanced, comprehensive optical inspection equipment that is capable of quickly and accurately scanning both wafers and masks for defects, particles, scratches, and other non-uniformities. This system is equipped with two high-speed cameras, a wafer stage, dual-core processor, and a powerful report generating engine that provide a convenient and reliable platform for product defect and quality assurance.
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