Used RUDOLPH NSX 105 #293647735 for sale

RUDOLPH NSX 105 is a versatile mask and wafer inspection equipment designed to handle a wide variety of inspection needs. The system comes with a high-resolution optical design and sophisticated software controls which allow for a full range of inspection tasks. RUDOLPH NSX-105 features an LED source and a high-resolution Digital Imaging Unit (DIS) with adjustable magnification settings. The DIS has a built-in autofocus function which allows users to easily capture and inspect the patterns of different mask and wafer specimen. The machine also has a proprietary Digital Signal Processing (DSP) module that enables automatic defect identification, making it ideal for automated mask and wafer inspection. The tool has a reliable means of intuitive manual control. It also boasts a comprehensive suite of automated tools including advanced background scan and Find Start/End tools for quickly scanning for target areas on wafer death parts or defective masks. It also has Automark which can identify feature types and categorize them as either good area (pass) or bad area (fail). This allows users to quickly verify the level of conformity of inspected masks or wafers. NSX 105 further offers a built-in defect inspection capability with multiple threshold settings and 3D algorithms. This feature allows users to detect non-intuitive defects even for wafers with finer lines. The asset also has an ergonomic design with an adjustable focus knobs and an intuitive User Interface (UI). This design minimizes operator fatigue and provides easy navigation of control menus and buttons. Finally, it includes a software package with a friendly Graphical User Interface (GUI) making it easy to interact with. In summary, NSX-105 is an advanced mask and wafer inspection model that comes with an intuitive User Interface, full automation, sophisticated software tools, and a versatile optical design. It is the perfect solution for ensuring high-quality process control through automated scanning, defect inspection, and verification.