Used RUDOLPH NSX 90 #293616602 for sale

ID: 293616602
Wafer inspection system.
RUDOLPH NSX 90 is an automatic mask and wafer inspection equipment designed for use in microelectronic fabrication. This system offers high-speed performance, powerful image processing capabilities, and improved defect detection accuracy. It is capable of detecting a wide range of defects, including nodules, voids, scratches, and contamination, while providing a clear and detailed image of the sample. NSX 90 provides a high-definition image resolution which is 10 times greater than usual. The unit is equipped with a variety of features, such as a Focus Control Machine, that allows the device to focus automatically on the sample and maintain constant adjustment while inspecting. It is also equipped with a Segment Control Tool which enables users to view and analyze each segment of the wafer individually. RUDOLPH NSX 90 is composed of an advanced inspection platform, a powerful image-processing processor, an inspection head and a high-resolution CCD camera. The asset is designed with a user friendly interface, allowing for a fast and efficient operation. It also provides an option for defect analysis, LED drive, and inspection image comparison. The model uses a full-color LED light source which offers a wide range of wavelength to ensure a reliable inspection. The exposure time can be controlled, allowing for the detection of even the smallest defects. Additionally, the equipment offers robust image processing algorithms, which are designed to optimize the analysis of the mask and wafer. Overall, NSX 90 is an excellent mask and wafer inspection system for microelectronic fabrication. It offers high-definition image resolution, and a variety of features, such as defect segmentation and comparison capabilities, making it perfect for detailed analysis. Additionally, its user-friendly interface makes it an ideal choice for users of any level of experience.
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