Used RUDOLPH WV 320 #9107037 for sale

RUDOLPH WV 320 is a high-performance mask and wafer inspection equipment that is specially designed to provide superior image quality and faster defect detection accuracy. It is capable of inspecting defect images up to 20X greater than those of conventional systems. RUDOLPH WV320 combines a high numerical-aperture lens system with a newly developed micro-frames detector module to ensure superior resolution and tilt detection. The unit's powerful optics allow for bright, clear images with superior sharpness, contrast and depth of field. The machine is also equipped with a comprehensive suite of masked wafer measurement and imaging features to help deliver fast and accurate results. WV 320 includes two advanced technologies to support its imaging potential- an active pixel detector (APD) and dark frame subtraction. The APD is a highly sensitive device that is capable of capturing images even in low-light conditions, making it ideal for high-resolution imaging. It is equipped with an enhanced anti-blooming control technology that ensures that only the most critical defects are collected, while any false signals are efficiently eliminated. The dark frame subtraction process is used to eliminate the effects of noise and other phenomenon in order to provide more accurate results. WV320 also features an integrated defect classification tool which is designed to provide quick and accurate defect classification with no need for additional pre-classification. It also comes with a data acquisition and archival asset which enables easy archival of results in a secure manner, while still allowing for manual intervention. The model is also compatible with RUDOLPH wafer inspection software which allows for complete quality control reporting and analysis. RUDOLPH WV 320 is capable of performing multiple inspections in either batch or single pulse modes, and can provide images with speeds reaching up to 20 fps (frames per second). It also features an important security feature, which prevents unauthorized access to the portfolio, as well as an integrated alignment equipment which ensures optimal conditions for defect imaging. RUDOLPH WV320 can also be linked to an external web controller in order to easily communicate with other production systems- such as sputter systems and lighting systems. Overall, WV 320 is a highly advanced and reliable mask and wafer inspection system. It is designed to provide superior image quality and faster defect detection accuracy, while also featuring a comprehensive suite of features for secure data handling and storage, as well as user-friendly operation. Additionally, it can be easily integrated with other systems in order to provide an ideal environment for mask and wafer inspection.