Used RUDOLPH WV 320 #9236889 for sale

RUDOLPH WV 320
ID: 9236889
Wafer Size: 12"
Vintage: 2007
Macro defect inspection system, 12" 2007 vintage.
RUDOLPH WV 320 is a technical inspection equipment designed to improve the quality of mask and wafer production. It is made up of four primary components: a two-dimensional vision system, an image classifier, an automated wafer inspection tester, and an intelligent sorting unit. The two-dimensional vision machine consists of cameras that take pictures of wafers and masks in various angles and orientations. This allows for the inspection of different elements like logic process layers or backside surfaces. Using advanced algorithms and image processing techniques, the tool can identify defects that would otherwise not be visible to the naked eye. The image classifier utilizes the two-dimensional vision asset's output to categorize and separate defective and non-defective masks and wafers. The model is then able to send the wafers and masks to the designated areas for either reworking or for release. The automated wafer inspection tester is the final core component. It uses machine vision and a variety of other testing technologies to detect electrical defects, optical defects, and other failure conditions. This equipment allows for faster and more accurate quality assurance, as well as improved throughput. Finally, the intelligent sorting system can automatically classify and prioritize different types of defects on a batch of wafers or masks. This helps streamline the sorting process and reduces the potential for errors and delays. In summary, RUDOLPH WV320 mask and wafer inspection unit is a state-of-the-art technical inspection machine designed to improve the quality and yield of mask and wafer production. By utilizing a two-dimensional vision tool, an image classifier, an automated wafer inspection tester, and an intelligent sorting asset, this model can accurately identify defects that would otherwise be difficult to detect and help industry professionals improve their throughput and productivity.
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