Used RUDOLPH WV 320 #9248810 for sale

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ID: 9248810
Wafer Size: 12"
Macro defect inspection system, 12" (2) BROOKS Loadports with FOUP Loadports carrier reader: RFID Type YASKAWA Robot Light source: Head: 20 um Xenon flash lamps Wavelength range: 480-750 nm Resolution: Above 25 um Function: YVS Server 3D Defect image generation Auto Defect Classification (ADC) function.
RUDOLPH WV 320 is an automated mask and wafer inspection equipment. It is designed for use in the semiconductor manufacturing process to detect and minimize defects in wafer processing. This system helps to reduce production costs and increase product quality. The unit is a 3-axis mask and wafer inspection machine based on advanced scan imaging technology. It includes an advanced automated stage mechanism with a robust and precise two-dimensional scanning feature, as well as a magnification control tool. The asset is capable of performing a wide variety of automatic mask and wafer inspections. It can detect submicron defects such as pattern discrepancies, particles and other surface irregularities. The model is also able to detect defective printing on wafers caused by contaminants or deruba mis-inspection. The equipment can scan areas ranging from 200mm to 400mm depending on the type of wafers to be inspected. The integrated magnification control system allows for real-time precise zooming and rotation of images for enhanced inspection accuracy. An advanced on-screen measurement function allows operators to accurately measure defect sizes using easy-to-use mouse clicks. The unit is also equipped with a True Color Display which provides 4K resolution, allowing for richer and more detailed images. The machine is user-friendly and can be easily operated and maintained. The tool features an intuitive user interface, and comes with an extensive library of pre-configured settings such as sample patterns, illumination settings, measurement criteria, and mask acceptance criteria. This allows for quick and accurate setup times and optimal control. The asset also features a built-in FITS functionality which is capable of archiving and tracking inspection work. This feature enables the operator to store data in digital form and quickly recall defects for comparison. RUDOLPH WV320 mask and wafer inspection model is an effective solution for ensuring the highest level of accuracy and repeatability for wafer production. Its advanced automated stage mechanism, magnification control equipment, intuitive user-interface, and robust True Color Display yields unparalleled quality control for the most demanding semiconductor applications.
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