Used RUDOLPH WV 320 #9315838 for sale

RUDOLPH WV 320 is a sophisticated mask and wafer inspection equipment designed to meet the challenges of the rapidly changing semiconductor industry. It combines high accuracy measurement and state-of-the-art optics to provide a comprehensive and reliable test and metrology solution for a wide range of applications. RUDOLPH WV320 utilizes an advanced CMOS-based technology for image capture. This allows for a high level of flexibility and accuracy when detecting defects and measuring surface features on masks and wafers. This system has the capability to inspect both opaque and transparent masks and wafers, which makes it useful for inspecting a wide variety of products. WV 320 also has exceptionally high imaging resolution and is capable of capturing images as low as one-micron pixel size, enabling it to detect the finest defects. This unit is capable of analyzing as much as four masks or wafers simultaneously, which makes it well suited for high-volume production operations. It also offers on-screen magnification for easier inspection and a range of automated measurement tools to speed up analysis of intricate features. WV320 further includes a powerful software package that enables the user to program complex inspection patterns and perform multiple types of measurements. This includes measuring to detect missing or broken mask patterns, inspect lines and shapes to ensure profile and size consistency, verify precise alignment of images, and detect contaminants. RUDOLPH WV 320 also supports mask and wafer fixturing, making it easier to inspect large and complex products. In summary, RUDOLPH WV320 is an advanced mask and wafer inspection machine that combines high accuracy and state-of-the-art optics to provide a comprehensive and reliable solution for a wide variety of applications. It offers high imaging resolution and automated measurement tools to make analyzing complex features easier and faster. Additionally, its powerful software package enables the user to program complex inspection patterns and can support mask and wafer fixturing.