Used RUDOLPH WV 320 #9355327 for sale

RUDOLPH WV 320 is an advanced, high-performance mask and wafer inspection equipment. It is equipped with a high speed CMOS sensor and includes an integrated static and dynamic inspection capability. The system is designed to support the inspection of mask and wafer objects up to and beyond those used in today's most advanced semiconductor processes. RUDOLPH WV320 includes an innovative, highly configurable metrology capability. This automated metrology capability is designed to deliver rapid and repeatable measurements of the critical dimensions and features of mask and wafer objects. It features automated defect and feature analysis, automated reporting, and comprehensive results tracking. The unit's high-resolution CMOS imaging and inspection capability enables users to make rapid and accurate decisions regarding the quality of their masks and wafers. It also allows users to exploit defect detection capabilities to quickly identify defects in mask and wafer objects. In addition, WV 320 is equipped with advanced image post-processing capabilities. This includes image sharpening capabilities, to identify and resolve features accurately, and image filtering to determine the acceptable ranges of features and defects. WV320 has a high degree of flexibility in algorithm configuration, allowing users to quickly and easily select specific algorithms to meet their production requirements. Furthermore, it can be configured to work with multi-camera applications, enabling users to leverage the scalability of the machine. RUDOLPH WV 320 also provides users with a range of powerful analysis tools, designed to deliver sophisticated fault, yield and statistical analysis capabilities. It also provides users with comprehensive interactive viewing and reporting capabilities. Both of these components help users to ensure quality control and troubleshoot issues quickly and efficiently. Overall, RUDOLPH WV320 is an advanced mask and wafer inspection tool that is well-suited for more demanding semiconductor processes. It includes robust inspection features, automated and configurable metrology capabilities, and powerful analytics capabilities. Therefore, it is an ideal choice for users who want to improve their production yield and quality control.