Used RUDOLPH WV 320 #9373222 for sale

RUDOLPH WV 320 mask and wafer inspection equipment is an inspection solution designed for fast and accurate metrology of wafers and semiconductor masks. The system consists of an opto-mechanical assembly, a camera and software and provides users with reliable, reproducible and automated measurements. The unit is capable of measuring wafers and masks with a 2-dimensional grid scan, and can move the wafers and masks up to 50 microns with the motorised stage. The machine is equipped with an ultra-high resolution CCD camera which provides high accuracy metrology measurements. It has an adjustable field-of-view which allows the user to move the camera from 3.2mm to 63mm. The camera supports multiple image acquisition modes, such as one dimensional, two dimensional, and area of interest scanning. The software suite provides the user with a range of features to manage the measurement process. The software suite includes a wafer data model editor, a data acquisition module, a metrology module and an automation module. Data can be acquired in the desired variations, such as 3x3 grid scan, linear scanning or line-by-line scanning. The data acquisition module allows for data to be imported from a variety of sources including photomasks, wafers, CAD drawings, and spectra. The metrology module offers easy to use user interface and yield analysis. The automate module allows users to program and automate the measurement process for iterative measurements, such as 3D grid scans, spatial scans and defect detection. RUDOLPH WV320 mask and wafer inspection tool is a powerful and reliable inspection solution for semiconductor masks and wafers. The asset provides precise and repeatable measurements with the ultra-high resolution CCD camera, and advanced metrology software that allows for automated metrology and defect detection. The model is well equipped to handle complex inspection projects with real-time user feedback and automated data acquisition. The equipment is fast, accurate and reliable, providing the user with an effective tool to inspect and verify semiconductor masks and wafers.