Used JEOL JWS 7505 #9131751 for sale

JEOL JWS 7505 is a scanning electron microscope (SEM) that uses a focused beam of electrons to create high-resolution images of a sample's surface or subsurface structure. The 7505 is equipped with a high-resolution field emission gun (FEG) that reduces pre-acceleration voltage and enhances secondary emissions for optimized imaging. Additionally, the 7505 can be used to create 3D reconstructions by acquiring multiple SEM image slices, increasing the accuracy of quantitative measurements and imaging of hard-to-image samples. The SEM also contains a state-of-the-art software package that allows users to control all of the microscope's functionalities, such as adjusting working distance and focus condenser lenses, and to program automated functions. The 7505 also supports image acquisition and analysis, including rapid image acquisitions and automated measurements to quickly determine parameters such as acceleration voltage and operational current for more accurate imaging. The 7505 is equipped with a 5-axis motorized stage that consists of 3 linear axes (X, Y, Z) and 2 rotational axes (tilt and rotation). The rotation axis can be used to generate multi-parameter imaging (MPI) images, and the tilt axis enables precise control of incident angles. The stage also offers an active temperature control system for samples requiring stable temperatures. The 7505 is also equipped with a range of imaging detectors that deliver high contrast images of samples. These detectors detect backscattered electrons, secondary electrons, reflected electrons and their alloys, and backscatter signals. Additionally, the detectors can pick up both chemical and physical information from the sample to provide a clearer image. The 7505 also contains an optional combination detector that can provide simultaneous detection of both secondary electrons and backscattered electrons. Finally, the 7505 offers an array of other features, such as a 60° tilt for high-angle imaging and variable pressure lenses for obtaining images in variable pressure environments without causing distortion. The 7505 also offers a wide field of view, allowing for larger sample analysis, and its energy dispersive spectroscopy (EDS) capability allows for elemental analysis in addition to imaging. This combination of features makes JEOL JWS-7505 a powerful and versatile tool for imaging and analysis.