Used LAM RESEARCH EP 200MMD #9141883 for sale

LAM RESEARCH EPM 200MMD is a high precision optical comparator designed for wafer fabrication in the microelectronics industry. The comparator is a multi-axis optical measuring instrument that is capable of making precise measurements of critical surface features in the manufacture of semiconductor wafers. It is matched with an efficient, high precision rotary table that facilitates precise and repeatable X, Y and Z axis measurements. The comparator consists of a high quality optical bridge-type optics for the measurement and vision systems, and offers superior accuracy and resolution. The precision optics of the comparator combine image projection, back surface backlighting and a circular chart for easy readings and smooth operation. The bridge-type optics is capable of magnifications from 4X to 400X, with true measurement capability from 0.5µm to 1500µm. The optical digital video interface ensures repeatability of measurements, allowing for fast adjustments of the image contrast, brightness, sharpness, exposure and magnification. The comparator also offers video capture and live images to ensure high accuracy measurements of increasingly complex surface features. LAM RESEARCH comparator utilizes an integrated reference optical system for enhanced light uniformity and to minimize optical aberrations. This helps to ensure reliable and repeatable measurements, as well as providing a reliable reference for positioning purposes. The comparator is also equipped with an advanced measurement software package which allows users to pre-program measurements and to automate routine tasks. Additionally, the software package includes powerful features to enable users to measure and inspect complex surface features of wafers directly from a digital image. LAM RESEARCH EPM 200MMD is built with a tough, rigid body construction for reliable performance and a long operational life. This comparator is designed for ease of use and is suitable for checking both flat and curved surfaces. It is equipped with a wide range of accessories to give users an efficient means of performing professional-grade quality control inspections of wafers. The optical comparator is designed to withstand rigorous testing and calibration demands in the production environment to ensure wafer surface finishes meet yield requirements.