Used PHILIPS / FEI STRATA DB235 for sale
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PHILIPS / FEI
Strata DB235
Focused Ion Beam Scanning Electron Microscope (FIB-SEM) Dual beam Multiple electron detector Ion det
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Popular Product
PHILIPS / FEI
Strata DB235
Scanning Electron Microscope (SEM) Hexalens electron column Magnum ion column Operating system: Wind
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