Used JEOL JBX-6300 #9393311 for sale

JEOL JBX-6300 is a scanning electron microscope (SEM) primarily used for imaging and microanalysis of samples. It features advanced imaging technology, allowing researchers to view and analyze specimens down to the nanometer scale. The microscope is equipped with a number of features that provide high resolution imaging and analysis capabilities. JEOL JBX 6300 is outfitted with a Thermo-FET ultra-high vacuum field emission gun, which is capable of producing a high resolution field emission source of electrons. This field emission gun enables researchers to achieve high resolution imaging of nano-scale targets. In addition, JBX-6300 possesses a multi-mode signal processing system, which allows researchers to switch between various imaging and processing modes. This system enables the user to select the optimal signal processing mode for their sample, allowing for greater analysis accuracy. JBX 6300 is equipped with several advanced imaging and analysis features, which include 3D, backscatter, and secondary electron imaging. 3D images provide a more accurate representation of the sample's topography than 2D imaging. Backscatter imaging allows for the detection of subtle features not visible to optical microscopes. Secondary electron imaging is used to detect compositional differences between sample and background. These imaging capabilities allow researchers to gain greater insight into structure and composition of samples on a nanometer scale. JEOL JBX-6300 is also equipped with a variety of sample manipulation features. The motorized stage enables the user to move the sample under the electron beam while the stage is tilted and rotated, allowing for easy navigation of the sample. In addition, the microscope is equipped with a gas cell to inject reactive gases for analysis. The gas cell allows researchers to analyze the samples under varying pressure and/or temperature conditions. In addition, JEOL JBX 6300 comes with an integrated X-ray microprobe which allows researchers to analyze elemental composition of samples in a non-destructive manner. The X-ray microprobe is capable of detecting light, heavy, and noble elements down to the nanometer scale. JBX-6300 is a powerful scanning electron microscope capable of imaging and micro analysis at the nanometer scale. It includes a variety of advanced features such as a field emission gun, multi-mode signal processing system, motorized stage, gas cell, and X-ray microprobe, providing researchers with powerful capabilities for viewing and analyzing nano-scale structures and compositions.