Used KLA / TENCOR 1007 #200859 for sale

KLA / TENCOR 1007 is a state-of-the-art prober designed to offer superior performance in all aspects of metrology, including wafer level and package level defects. It can perform both electrical testing and optical inspection, and is capable of handling a wide variety of deviation tasks such as die size, bow, coplanarity, and wafer flatness. KLA 1007 offers high speed capability for fast test times, and is capable of scanning annular as well as random areas for maximum detection. It also has high resolution spatial sampling for multiple points per second, and is capable of both wafer and package level imaging. The prober comes with an intuitive graphical user interface for easy setup and operation, and can be integrated with most of the standard software packages. Its onboard features are designed to provide easy access to critical parameters for automated test sequences and processes. The prober is equipped with 4 floating stages, X-Y-Z motion, and long travel range. It has an X-Y range of +/- 200 mm and Z range of 20 mm, with a total travel range of +/- 100 mm. In addition, all prober movement components are enclosed in a Boron Nitride chamber, ensuring low-contamination testing. TENCOR 1007 also comes with a range of package handling and prober accessories, including feeders, test heads, prober adapters, and motion hardware. This makes it easy to integrate the prober into any integrated process sequence for accurate results. Finally, 1007 can be purchased with a range of available service and support options such as preventative maintenance and customized solutions. The company also offers a wide range of data analysis tools to aid in evaluating and troubleshooting test results. With the aid of these tools, customers can have peace of mind knowing that their process tests are reliable and accurate.