Used KLA / TENCOR 1007 #9012498 for sale

KLA / TENCOR 1007 is a state-of-the-art probing equipment used in automated defect inspection and metrology applications. It is an automated, optical microscope tools designed for precision wafer level analysis within the semiconductor industry. It allows for rapid analysis of the electrical characteristics of a semiconductor wafer without the manual manipulation and/or handling of each die. KLA 1007 prober has features including 100 mm and 150 mm wafer compatibility, auto-docking, automated site recognition, optimized sample transport, variable-height pneumatics, advanced imaging, and third-party tool integration. The prober is capable of collecting extremely fine resolution images of the wafer and the individual die for greater depth of analysis. TENCOR 1007 is designed to accommodate a variety of substrates including silicon-on-insulator, gallium-arsenide, silicon oxycarbide, silicon-on-sapphire, and others. Additionally, its flexible design allows for a wide range of temperature variations, enabling operations from -45°C to +125°C. The ability to accommodate large beryllium-oxide (BeO) and sapphire-silicon (SaSi) wafers is a key feature of this prober due to their thicknesses. The system offers a reliable and repeatable alignment procedure to inspect each die. 1007 provides a platform with flexible probe card styles and automated contact algorithms to ensure product integrity through improved accuracy and yield. The built-in extension cable assemblies reduce the need for maintenance, while its 4-finger actuation enables higher throughputs with guaranteed positioning accuracy. With the built-in Cam-iVision application package, the unit is capable of making a variety of precise measurements while collecting a wide range of large format images. The Cam-iVision package also offers automated scan modes, automatic wafer edge finding, and data analysis capabilities. Overall, KLA / TENCOR 1007 Prober provides superior electrical defect detection and metrology performance, while streamlining the analysis process. As a comprehensive machine, it offers a wide range of features and capabilities, designed to ensure optimum device performance and wafer utilization.