Used KLA / TENCOR 1007 #9086381 for sale

KLA / TENCOR 1007 is a multi-purpose, full-wafer monitoring prober designed for a variety of applications. It is capable of monitoring up to 50,000 sites in real-time and can be used in yield management, failure analysis, and in-process optimization. The robust equipment features a customized set of interchangeable probes that can be configured for any wafer size, from 12" to 300mm. The system offers a variety of resources for test execution, including: integrated high-speed image capture, multiple field of view (FOV) measurement, and programmable optics. The unit's optical machine comes with variable aperture sizes and a robotic wafer stage, allowing for precision motion control. Additionally, the tool is equipped with a highly accurate test pattern recognition engine that can quickly find and measure defects that may be missed by a standard defect detector. KLA 1007 provides a suite of advanced analytics that enable users to derive key insights from their data. This includes statistics and correlation analysis, clustering and classification, process control systems, and predictive analytics. Additionally, users can access traceable test data during and after testing, allowing for sophisticated analysis and comparison of multiple test results. The prober incorporates a number of safety features to help protect both equipment and personnel. It includes an E-stop, lockout core tags, and a unique dust containment asset that keeps the test environment clean and safe. Additionally, the model is designed to minimize the risk of human error in testing and manufacturing processes. Finally, TENCOR 1007 is designed to be upgradeable and contains numerous maintenance features to keep it running at peak performance. Not only does this ensure efficiency in production processes, but it also helps maintain a safe work environment for the user.