Used KLA / TENCOR 1007 #9094261 for sale

KLA / TENCOR 1007 is a high-performance, multi-purpose electrical prober with exceptional accuracy and repeatability. KLA 1007 can be used for a variety of probing procedures, such as wafer testing, single-chip testing, and burn-in testing. It has a general-purpose layout that allows flexible configurations to optimize the prober for any specific application. TENCOR 1007 is an 8 GIO (eight-column interconnecting nozzles) platform designed for the fabrication of nano-scale devices. The nozzles have a high-density packaging with narrow pitch and height to meet requirements for small die and near-atom-scale testing. The prober's multiple pins and single-point contact tester enables precise contact measurements with accuracy down to nanometers. The prober's open architecture allows users to modify their probe test performance based on the needs of their project. This flexibility allows for customization of the test head, test head lift limits, and probe cards, allowing for tailored probing solutions for each individual application. 1007 also features an automated alignment equipment, allowing for quick and accurate measurement of wafers at angles up to eight degrees off-axis. It has a high-precision, high-force measurement system that is capable of measuring small contact forces and doing precise contact force measurements. KLA / TENCOR 1007 also has a load-measuring capability to accurately test probe force levels in spikes, bands, or other movements. Lastly, the prober is equipped with a high-speed vision unit with a field of view of 16mm and a resolution up to 10 µm, ensuring that any small flaws that may be left behind during testing are spotted and rectified quickly. This machine can find and inspect samples from a variety of angles and distances, as well as carry out real-time alignment and calibration of the test and measurement systems. KLA 1007 is the ultimate prober for architecture flexibility, repeatability, and precision measurements for processes from single-chip to burn-in testing. Additionally, its modular design and high-speed vision tool enable versatile test configurations and powerful metrology capabilities.