Used KLA / TENCOR 1007 #9226753 for sale

KLA / TENCOR 1007 is a wafer probing equipment designed for high throughput, low cost metrology and inspection of semiconductor wafers. Designed with proprietary technologies that enable maximum automation, KLA 1007 prober improves yields and reduces overall manufacturing costs. TENCOR 1007 features an advanced SmartView® optical system that offers a large area of x-ray vision, making it easy to identify cross-section changes in wafers. This unit also helps to eliminate the need for manual inspections of a few wafers, as it can detect anomalies from across the entire wafer, reducing costs and maximizing efficiency. The SmartView® machine also allows for automatic height correction, helping to ensure accuracy. 1007 also includes a high-speed C-SAM® measurement tool, designed to accurately measure surface irregularities in the nanometer range. This asset works by projecting a polarized laser beam at the surface of the wafers. When the laser beam reflects off the surface, the polarized image is captured by a high-precision CCD camera, allowing for highly accurate measurements and an unparalleled level of inspection. In addition to the SmartView® and C-SAM® features, KLA / TENCOR 1007 also boasts a self-adaptive temperature control model, designed to provide an optimal measurement environment for each wafer. By maintaining a consistent temperature, KLA 1007 can ensure accurate and consistent results, even when dealing with a mix of different wafer types. TENCOR 1007 provides the accuracy and reliability needed to meet the demanding requirements of next-generation semiconductor manufacturing. With its high-tech features and ability to handle a variety of wafer types, 1007 is well-suited to help improve yield and reduce overall costs. Whether testing for cross-section changes, measurement irregularities, or a variety of other features, KLA / TENCOR 1007 can offer the accuracy and speed needed to keep up with changing technology.