Used KLA / TENCOR 1007E #293827387 for sale

Manufacturer
KLA / TENCOR
Model
1007E
ID: 293827387
Prober.
KLA / TENCOR 1007E is a leading, cost-effective prober suitable for non-contact measurements and inspection of small samples. It is specifically designed for high-precision automated defect inspection, critical dimension measurement, test diagnosis, and material characterization. KLA 1007E prober has a large variety of high-performance, integrated features and options, providing reliable and repeatable data for the most challenging projects. TENCOR 1007E prober is a highly automated device for advanced probing applications. It uses a precision x-y stage and a detection subsystem with a high-speed image data acquisition system. This allows for automatic detection and control of defects, critical dimensions, and other data. The system is compatible with a wide range of probes, with precision ranging up to 0.25 nanometers. An additional sample manipulator can be used to manipulate wafers and increase the range of application than 1007E is capable of handling. KLA / TENCOR 1007E prober also features a rugged, integrated test environment that is capable of non-contact measurements and inspections. This improves performance and ensures accurate results even when measuring in difficult conditions. It allows for a wide range of sample sizes and probing protocols, providing a great deal of flexibility and control over the collected data. KLA 1007E prober is particularly useful in the semiconductor industry, where extremely accurate and reliable inspection and testing are essential. It can be used to analyze a range of materials, including polyimide and silicon, providing accurate and reproducible results. In addition, the device is capable of collecting data on a range of nanometer-scale measurements, enabling effective analysis of microstructures and other nanometer-scale features. Overall, TENCOR 1007E prober is a cost-effective, reliable prober suitable for high-precision automated defect inspection, critical dimension measurement, test diagnosis, and material characterization. It offers a wide range of features, high performance, and flexibility, making it an invaluable asset to many industries.
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