Used KLA / TENCOR 1007E #9254091 for sale

KLA / TENCOR 1007E Prober is a multi-application prober designed for semiconductor device testing operations. The prober is built with a combination of components including a fully automated DPM (Digital Pattern Measuring) module, a stage, stepper motor, and opto-mechanical head. This combination of components provides a high-performance, reliable, and accurate way to test small integrated circuits. The DPM module features a high-definition resolution monitor, allowing for accurate pattern measurements, as well as dedicated video processing components, such as frame buffers and CCD imaging chips. The stage features a closed loop stepper motor that is capable of accurately positioning the sample for probing at speeds between 0.1 and 2.0 microns per second or higher. The opto-mechanical head utilizes an optical imaging system to accurately align the probes to the surface of the sample. The head is also capable of rapidly adjusting its position, allowing for repeatable, low-noise probing. KLA 1007E Prober is designed to be a versatile and efficient system for testing and characterizing semiconductor devices. The prober includes an integrated Stage Control Console (SCC) that is used to configure, control, and monitor the prober's operation. The SCC features a control panel that provides access to all prober commands, as well as a graphical user interface for setting up and monitoring the prober's performance in real-time. Additionally, it offers program files that enable users to store and recall probe and stage configurations. TENCOR 1007E Prober is designed to be compatible with various probing systems, including contact probes, strain gauge probes, litz wires, and open pin probes. It can also be used with dielectric probes for thermal characterization. The prober is equipped with a digital Input Output (I/O) port to connect to a PC for data acquisition and control. Built-in isolation layers protect the device from static, heat, and other disturbances that may affect the measurements. In summary, 1007E Prober is a multi-application automated prober for semiconductor device testing operations. It has a highly accurate DPM module, a reliable stepper motor for positioning the sample, and an opto-mechanical head for repeatable probing. The prober is compatible with various probing systems, and features a Stage Control Console for programming, control, and monitoring. The built-in isolation layers protect the device from various environmental influences, allowing for precise and reproducible measurements.