Used KLA / TENCOR 1007HF #141211 for sale

KLA / TENCOR 1007HF Prober is a state-of-the-art wafer probing solution designed to deliver and inspect automated wafer-level device testing with unequaled accuracy and throughput. KLA 1007HF Prober offers unprecedented benefits for semiconductor manufacturers, such as faster test times, higher accuracy, and improved yield performance. It is designed for high resolution and high repeatability, making it the ideal choice for process development and test characterization. TENCOR 1007HF Prober features a proven, open-architecture platform that supports test and characterization of a variety of wafer types and complex device structures. It utilizes advanced probes, such as Pitch Control Wafers (PCW's), 2- to 6-dimensional Assembly Lane Sliced Wafers (ASW's) and Application Specific Integrated Circuits (ASIC's). 1007HF Prober also supports single and multi-hit testing with several high-speed patterns. KLA unique, low-level electrical characterization capabilities allow engineers to extrapolate data collected on wafers with high-speed, high-resolution measurements. KLA / TENCOR 1007HF Prober offers a suite of robust test algorithms that provide accurate results, regardless of complexity. In addition, KLA 1007HF Prober streamlines the testing process by supporting automated load, unload, and sort functions. TENCOR powerful, closed-loop probe control technology ensures that test steps are accurate, repeatable, and reliable. TENCOR 1007HF Prober provides a software-controlled solution for handling wafer probing requests, with the added benefit of powerful software-based scan acceleration. This enables the user to customize scans for optimal performance and yields. 1007HF Prober features an advanced vision system with a suite of advanced imaging capabilities. This system accurately detects defects to ensure that only the highest quality wafers are tested. It also measures and reports on critical dimensions, adsets, and background properties. KLA / TENCOR 1007HF Prober is highly flexible and capable of being configured as a single or multiple-probe system, providing unlimited scalability and additional performance. Its compact design and modular configuration allows it to be easily and quickly modified for specialties such as 300mm wafer testing and high power applications. KLA 1007HF Prober is the ideal wafer prober solution for semiconductor device testing and is perfect for test labs requiring high performance and accurate measurements.