Used KLA / TENCOR 1011 #9132317 for sale

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KLA / TENCOR 1011
Sold
Manufacturer
KLA / TENCOR
Model
1011
ID: 9132317
Wafer prober.
KLA / TENCOR 1011 is a prober typically used in the fabrication of microelectronics, such as computer chips and other components. It is capable of performing electrical, optical and mechanical probing processes on a wide range of materials, including wafers. KLA 1011 is a precision surface probing and temperature or humidity measurement equipment that features an automatic wafer-handling system and advanced digital imaging capabilities. This prober is designed to ensure consistent accuracy and repeatability in order to guarantee high-quality results. It can be used to inspect, pinpoint, and characterize physical anomalies of a wide variety of thin-film materials. Its automated wafer-handling unit allows for easy wafer loading and unloading as well as rapid wafer selection and sampling. Its advanced digital imaging capability allows for quick evaluation and scanning of samples to detect anomalies, such as scratches, edge chipping, particles, and other defects that could affect performance. TENCOR 1011's proprietary thermal annealing technology can also be utilized to correct damaged thin-film samples. 1011 utilises proprietary software to monitor the entire probing process and allow for detailed measurements of wafer and chip defect areas. High-precision probe points and full mechanical control of the entire machine ensure accuracy and repeatability. In addition, KLA / TENCOR 1011 is capable of measuring temperature and humidity in environments ranging from 10°C to 60°C and 30% RH to 90% RH, respectively. It is equipped with a variety of probes, allowing for precise measurement of different materials. Its current control tool also enables accurate electrical testing to measure resistance with 1000x voltage accuracy. KLA 1011 prober is an essential part of modern microelectronic manufacturing processes, providing the accuracy and repeatability required to ensure high-quality products. Its advanced software and control systems are able to precisely measure and evaluate the physical and electrical characteristics of a wide range of thin-film materials, enabling reliable, consistent results.
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