Used TEL / TOKYO ELECTRON P-12XLm (PRECIO) #182710 for sale

TEL P-12XLm (PRECIO) prober is a fully-automated, large-diameter prober with an exceptionally large scan area. It is a highly versatile tool that can accommodate a large range of substrates, ranging in size from small wafers to large multi-die substrates. The P-12XLm is equipped with state-of-the-art pattern recognition system that enables it to detect defects across a wide variety of substrates and features. The P-12XLm prober has a large scan area of 30 X 30 mm that is capable of probing large circuit boards with numerous chips, as well as probing small dies. Furthermore, its large scan area allows for multiple probing points with one substrate, reducing the time and complexity of the test process. The P-12XLm has an automatic signal management feature that makes it easy to manage and analyze data. The signal management can be customized and can be set to detect either high or low signals from all parts of the board. The P-12XLm prober has two-axis motion control with a resolution of 0.2 μm, enabling it to accurately measure the defects on the substrate. The P-12XLm is also capable of transferring the measured data directly to a PC. This enables rapid data processing and analysis, allowing for faster debugging processes. Another advantage of the P-12XLm is its superb accuracy and repeatability. By utilizing a high-precision, noise-reduction mechanism, and high precision two-axis motion control, the P-12XLm is capable of achieving spot defects even up to 1 μm in diameter. Furthermore, the P-12XLm can measure at scanning speeds up to 500 probing points per second. TOKYO ELECTRON P-12XLm prober is a cost-efficient and reliable prober for large substrate testing. It has a wide scan area that is capable of probing multiple substrates, an automated signal management system, and two-axis motion control that enable it to accurately measure even the smallest defects. Furthermore, it can be quickly and easily connected to a PC and with its high-precision capabilities, it is the perfect tool for high-speed, high-precision substrate testing.