Used ADE / KLA / TENCOR 8100 #194458 for sale

ADE / KLA / TENCOR 8100 Scanning Electron Microscope (SEM) is a high-resolution, advanced imaging tool for a wide range of materials characterisation applications. ADE 8100 has been designed to deliver advanced imaging and analysis capabilities with a maximum resolution of 3nm and maximum magnification of 5,000x. It features an adjustable low-vacuum chamber for fully automated sample loading and unloading, allowing for rapid imaging and analysis. It also features advanced detector technologies with an ultra-low background noise, as well as a five-position motorised sample stage for precision imaging and analysis. KLA 8100 is capable of advanced imaging techniques, such as focus ion beam (FIB) imaging, backscatter electron (BSE) imaging, and secondary electron (SE) imaging. These techniques provide superior imaging and analysis capabilities when investigating the surface or individual physical and chemical processes within a material. It is also able to perform elemental analysis, such as EDX and X-ray spectroscopy, to accurately identify the elemental composition and chemical breakdown within a sample. TENCOR 8100 also provides automated semi- and non-contact imaging modes for magnification ranging from 10x to 5000x. This allows for the investigation of larger sample areas without any need for manual adjustment of the sample stage. The range of imaging and analysis capabilities and resolutions provided by 8100 make it the ideal tool for the study of materials and their properties on a molecular level. In addition, ADE / KLA / TENCOR 8100 includes a graphical user interface (GUI) which can provide real-time analysis of images and data output. ADE 8100 also includes a variety of automated imaging modules, such as SEM and FIB imaging, EDS and EBSD analysis, and XAS and XRD analysis. The combination of these features makes KLA 8100 an ideal tool for researching, diagnosing and analysing a wide range of materials.