Used AMAT / APPLIED MATERIALS 7830 #9384839 for sale

AMAT / APPLIED MATERIALS 7830
ID: 9384839
Critical Dimension Scanning Electron Microscope (CD-SEM).
AMAT / APPLIED MATERIALS 7830 is a scanning electron microscope, or SEM, that is used for high-resolution imaging and analysis of the surface contours of a variety of materials. It is equipped with a range of detectors and a field emission gun (FEG) electron source. This allows it to produce high-resolution images with a range of magnification from 10× to 20,000×. Additionally, it has advanced capabilities to analyze the microstructure, thin film thickness, and composition of materials at a nanoscale level. The core components of AMAT 7830 SEM include the electron source and a variety of detectors. Its robust electron source enables excellent image resolution, brightness, and contrast and supports high-resolution imaging on a wide variety of materials including inorganic and organic materials. Using its various detectors, APPLIED MATERIALS 7830 can detect significant differences in the topography of different materials, detecting even very fine features like small particles and microstructures. It also offers backscattered electron (BSE) imaging, used to analyze the thickness of thin films, and energy-dispersive X-ray (EDX) analysis, which can provide information about the elemental composition of the material being studied. 7830 has features that benefit both its performance and usability. Its digital interface and phase-contrast imaging display capability make it easy to use, while its integrated optics and computer-controlled detection provide precise control of the imaging parameters. Additionally, the SEM has high-speed autofocusing and the ability to store image data for later comparison. It also has an automated stage for precise sample positioning and precise z-axis movement for maximum image quality. AMAT / APPLIED MATERIALS 7830 is a versatile tool for studying the nanoscale structures of a wide variety of materials. Its high-resolution imaging, automated stage, and wide array of detectors make it an effective way to analyze thin films and other microstructures at a nanoscale level. AMAT 7830 is an ideal choice for researchers looking for a reliable and versatile SEM.
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