Used AMAT / APPLIED MATERIALS Opal 7830 #9124324 for sale

AMAT AMAT / APPLIED MATERIALS Opal 7830 Scanning Electron Microscope (SEM) is a high performance imaging and analytical tool used for the observation, imaging, and analysis of a variety of sample types, including semiconductor, biomedical, materials, and industrial samples. This instrument is an ideal choice for complex failure analysis, materials research, and microscopy applications. It features an Extended Low Vacuum (ELV) Mode, which allows for the imaging of samples in non-evacuated atmospheres, such as ambient air or gaseous samples. This electron microscope has a scanning type, automated secondary electron image detector (SEI), for the acquisition of high resolution images at the highest possible speed. Additional advanced imaging and analysis capabilities include automated spatial resolution mapping, spectral imaging, and signal processing. AMAT Opal 7830 Scanning Electron Microscope is capable of collecting a wide range of signal types, including backscattered electrons (BSE), secondary electrons (SE), schlieren, cathodoluminescence (CL),and energy dispersive spectroscopy (EDS). The instrument also includes dual detectors, allowing for simultaneous imaging and feature measurement. This powerful electron microscope has a maximum resolution of 15nm, allowing for accurate imaging at the nanoscale. With the ELV Mode, this model can capture large area images of objects without evacuation. In addition, APPLIED MATERIALS Opal 7830 offers a dual-beam imaging equipment, which allows the user to move a focused electron beam over the entire sample surface. This enables high-sensitivity imaging, revealing details with a low signal-to-noise ratio (S/N). The vibrational noise reduction system ensures low noise imaging, so the sample can be examined in high resolution without sacrificing imaging quality. The SEM is also equipped with a wide range of automation capabilities, including an automated focus corrector, optical alignment unit, and automated stage control. These features allow the user to accurately control the features of the microscopic sample, such as the size and location of features. Additionally, this machine has an integrated software package that allows for the analysis of the respective data acquired from the SEM. Overall, APPLIED MATERIALS Opal 7830 Scanning Electron Microscope is an ideal choice for complex failure analysis, materials research, and microscopy applications. The instrument's powerful 5-axis motorized sample stage, low-vacuum imaging capabilities, and dual-beam imaging make it a quick, yet accurate imaging tool.