Used AMAT / APPLIED MATERIALS Opal 7830 #9238602 for sale

AMAT / APPLIED MATERIALS Opal 7830 Scanning Electron Microscope (SEM) is a powerful and versatile analytical tool used to provide detailed, three-dimensional images of internal structures of a wide range of materials. It offers unsurpassed features for analyzing and characterizing a variety of materials and processes. The SEM includes an integrated monochromated field emission electron gun (FEG) which provides high beam currents and minimal thermal spread, allowing for the highest resolution imaging at the lowest electron beam-accelerating voltage. With its variable spot sizes, the 7830 SEM offers variable depth of field, variable resolution, and variable sample surface coverage. It also comes equipped with a stigmator to correct beam condenser aberration, setting it apart from comparable SEM systems. The device is equipped with an integrated electron gun, providing a high- brightness and angle-stable beam. This enables exceptionally high image resolution, and by leveraging a long lifetime of the EIG, users have the ability to record 99-second long scan times for producing concurrent ESD signals. With a specially designed double optic design, the 7830 produces an image with much higher contrast and clarity to traditional Scanning Electron Microscopes (SEM). The 7830 SEM has the ability to achieve a much higher spatial resolution of 0.5nm at 6.0 kV, making it ideal for applications where ultra-high performance is desired. With its automated specimen transfer system, users have the ability to quickly change specimens and optimize workflow. The 7830 has a long lifetime due to its advanced EIG technology, and its motorized control range for the various features of the device makes it simple and easy to use. The 7830 can also be utilized for conducting impurity analysis to detect contamination in semiconductor materials. It has the ability to detect particles and defects down to 0.1µm in size and can perform both energy dispersive x-ray spectroscopy (EDS) and analytical scanning (AS). The 7830 is equipped with an array of tools to support advanced research and engineering for a variety of industries. These tools include an advanced image acquisition system, real-time image analysis, 3D image reconstruction, image quantification, and automated report generation. AMAT Opal 7830 SEM is an ideal choice for those seeking a top-of-the-line SEM with maximum versatility and exceptional performance. Its unmatched flexibility and technical capabilities make it an ideal choice for a broad range of materials research and analysis applications.