Used AMAT / APPLIED MATERIALS OPAL 7830I #9256868 for sale

AMAT / APPLIED MATERIALS Opal 7830i Scanning Electron Microscope (SEM) is a powerful, high-resolution research tool used to gain insight into the microstructure and composition of materials, making it suitable for a range of scientific disciplines such as materials and advanced photonics research, medical research, and semiconductor process technology. AMAT Opal 7830i is a field-emission SEM, meaning it features a cold field emitter as its source of electrons. This type of emitter has higher brightness and directivity than X-ray sources, which means APPLIED MATERIALS 7830I can produce extremely high-resolution images. The SEM is equipped with a range of detectors, allowing it to detect backscatter electrons, secondary electrons, take X-ray energy dispersive x-ray spectroscopy (EDX) and wavelength dispersive x-ray spectroscopy (WDS) data, as well as generate high-resolution secondary electron and backscatter electron images. The machine utilizes a touchscreen user interface that's easy to use and highly customizable, and comes with a range of automated processes to streamline experimental setup and analysis. For example, the Automated Imaging System enables complex sample analyses to be completed quickly and accurately by automating the positioning of the sample in the image field, sampler loading, and image acquisition. APPLIED MATERIALS Opal 7830i also features a vacuum chamber with an automated turbo pumping system to minimise the time taken to stabilize desired pressure. In addition, the high column stability and stage accuracy enables the sample surface to be resolved both in core imaging and high-resolution topography maps. Opal 7830i is equipped with a range of additional features to ensure high-quality imaging and characterization. The automated EDX and WDS spectrometry systems make it easy to analyze elemental composition, while the automated energy gap correction and phase compensation techniques eliminate any instability due to energy or sample drift. Finally, the Edge Detection algorithm allows fine details within an image to be revealed. Overall, AMAT 7830I Scanning Electron Microscope is a powerful and versatile tool that provides a range of useful features and high-resolution imaging capabilities. Its wide range of automated processes and intuitive touchscreen user interface make the SEM ideal for scientists and researchers who need to collect high-resolution images and even elemental data from their samples.