Used AMAT / APPLIED MATERIALS / OPAL 7830Si #9229365 for sale
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ID: 9229365
Vintage: 1998
Critical Dimension Scanning Electron Microscope (CD-SEM)
With (2) parts systems
Robotic loader
1998 vintage.
AMAT / APPLIED MATERIALS / OPAL 7830Si is a state-of-the-art scanning electron microscope designed for use in research and industrial applications. It features a dedicated high-sensitivity electron beam with a large depth of focus for two-dimensional imaging. An advanced on-board processor allows for the acquisition of images and image manipulation in a fraction of the time of traditional SEM systems. AMAT 7830Si offers an optical zoom of up to 200,000x with an upper limit of 300,000x. Images are captured with an integrated, multi-channel detector, allowing for simultaneous operation of multiple detector types, including a secondary electron, backscatter electrons, and more. OPAL 7830Si is specially designed for imaging a wide array of sample types, including inorganic samples, organic restorations, nanomaterials, and more. It also has a "dual beam" capabilities, which allow for superior imaging of sample details by combining the conventional SEM beam and a focused ion beam. 7830Si also features an improved contrast with maximum noise reduction, making it suitable for a variety of imaging applications. It comes with a range of additional features and capabilities, such as image analyses and measurements, specimen alignment, drift scanning, and automated particle sizing and counting. APPLIED MATERIALS 7830Si is designed with advanced features designed to ensure maximum reliability and easy operation. Its simple-to-use user-friendly interface is intuitive, making it suitable for new users, as well as experienced microscopists. AMAT / APPLIED MATERIALS / OPAL 7830Si also includes built-in thermal management systems to protect the instrument during high vacuum conductance, as well as a wide range of user-selectable options to tailor the instrument to best suit a users requirements. Overall, AMAT 7830Si is a top of the line scanning electron microscope that best suits a variety of imaging applications. It is suitable for both beginners and experienced users and offers a wide range of advanced features and options to ensure maximum reliability and superior image quality.
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