Used AMAT / APPLIED MATERIALS / OPAL 7830Si #9245098 for sale

AMAT / APPLIED MATERIALS / OPAL 7830Si scanning electron microscope (SEM) is a high-resolution imaging and analytical equipment capable of producing high-contrast images of samples down to a few nanometers in size. The SEM is the most powerful tool available to analyze the microstructural detail of a sample and to image its surface features. AMAT 7830Si utilizes an accelerating voltage of 0-30 kV and has a current resolution of 10 pA for superior resolution imaging and color. It is composed of two main components, the main digital image unit and the scanning electron microscope itself. The digital image unit contains the software, which provides various display and analysis functions. These include interactive measurements, high-resolution digital imaging, detailed statistical analysis, digital imaging and film recording. The SEM is equipped with a high-resolution field emission source, which provides high magnification and superior resolution imaging capabilities. The samples are positioned within the large chamber of the SEM and then exposed to a beam of electrons, which scan across its surface in a raster pattern. The scattered electrons then collect on a detector, providing information on the surface features and structure of the sample. OPAL 7830Si is capable of a range of imaging modes and analytical techniques, including secondary electron imaging, backscattered electron imaging, dark-field imaging, and x-ray microanalysis. The SEM also includes an EDX system for elemental analysis, comprising a detector and an x-ray generator. The unit is also able to detect and analyze optical emissions such as cathodoluminescence and photoluminescence. The SEM is a sophisticated machine, ideal for applications such as materials science, semiconductor and metallurgical analysis, forensics, and microelectronics. 7830Si is highly reliable and user-friendly, offering an ergonomic design, intuitive user interface, and a range of image-enhancing capabilities, such as contrast magnification, digital filters and noise suppression. APPLIED MATERIALS 7830Si scanning electron microscope is an exceptional tool for high-resolution imaging and analytical techniques, offering a versatile solution for numerous applications.